Dr Mykhailo Klymenko | ARC Centre of Excellence in Exciton Science

Dr Mykhailo Klymenko

Research officer

Mykhailo Klymenko is a theoretical physicist specialized in semiconductor physics, device physics, nano- and optoelectronics. He has extensive experience in large-scale computations of electronic structure and optical response in semiconductor nanostructures.

Qualifications: 
PhD in Optics and Laser Physics, V.N. Karazin Kharkiv National University, Ukraine (2011)
MSc in laser and optoelectronic engineering, Kharkiv National University of Radio and Electronics, Ukraine (2005)
ORCID iD: 
0000000246418977
Centre Research: 

I study exciton transfer processes across the interface between organic and iorganic semiconductors as well as the effect organic covering layer on the electron transport in inorganic semiconductor. My work is related to the development of computational methods to characterize the mentioned above systems.

Centre Research Themes: 
2. Control of Excitons
Summary of any other of your centre responsibilities: 

Member of ECR committee since 2019

Publications

Journal Articles
Klymenko, M. V.; Vaitkus, J. A.; Smith, J. S.; Cole, J. H. NanoNET: An extendable Python framework for semi-empirical tight-binding models. Computer Physics Communications 2021, 259, 107676 DOI: 10.1016/j.cpc.2020.107676. doi: 10.1016/j.cpc.2020.107676
Booth, J. M.; Klymenko, M. V.; Cole, J. H.; Russo, S. Accurate calculation of excitonic signatures in the absorption spectrum of BiSBr using semiconductor Bloch equations. Physical Review B 2021, 103 (11) DOI: 10.1103/PhysRevB.103.115203. doi: 10.1103/PhysRevB.103.115203
Meftahi, N.; Klymenko, M. V.; Christofferson, A. J.; Bach, U.; Winkler, D. A.; Russo, S. Machine learning property prediction for organic photovoltaic devices. npj Computational Materials 2020, 6 (1) DOI: 10.1038/s41524-020-00429-w. doi: 10.1038/s41524-020-00429-w
Klymenko, M. V.; Vaitkus, J. A.; Cole, J. H. Probing Charge Carrier Movement in Organic Semiconductor Thin Films via Nanowire Conductance Spectroscopy. ACS Applied Electronic Materials 2019, 1 (8), 1667 - 1677 DOI: 10.1021/acsaelm.9b00354. doi: 10.1021/acsaelm.9b00354